| Title |
Evaluation of the Crystalline Quality of Cdte and CdZnTe with a Double Crystal X-ray Diffraction Technique |
| Authors |
송원준(Won Joon Sohng); 금동화(Dong Wha Kum); 서상희(Sang Hee Suh); 임성욱(Sung Wook Lim); 이태석(Tae Suk Lee); 김재묵(Jae Mook Kim) |
| Abstract |
The crystallinity of CdTe and CdZnTe grown by Bridgman method were evaluated using a double crystal diffraction technique. The FWHM of the rocking curve was compared with the etch-pit density. FWHM increased with the increase of etch-pit density, the increasing rate depending on the density and distribution of etch-pits. |