| Authors |
(Min Su Kim); (Soa Ram Kim); (Gi Woong Nam); (Hyung Gil Park); (Hyun Sik Yoon); (Jae Young Leem) |
| DOI |
https://doi.org/10.3365/KJMM.2013.51.1.063 |
| ISSN |
1738-8228(ISSN), 2288-8241(eISSN) |
| Keywords |
ZnO; porous Si; nano pore; sol-gel; optical properties; atomic force microscopy; photoluminescence |
| Abstract |
Nano-fibrous ZnO thin films were grown on porous silicon (PS) by sol-gel spin-coating method. Atomic force microscopy, X-ray diffraction, Raman, and photoluminescence were carried out to investigate the structural and optical properties of the nano-fibrous ZnO thin films. When the nano-fibrous thin films were grown on PS, their residual stress could be reduced, and the full width at half maximum (FWHM) of the ZnO (002) diffraction peak and near-band-edge emission (NBE) peak were decreased, indicating that the optical as well as the structural properties were enhanced. Furthemore, white light emission was observed from nano-fibrous ZnO thin films grown on PS. |