The Journal of
the Korean Journal of Metals and Materials

The Journal of
the Korean Journal of Metals and Materials

Monthly
  • pISSN : 1738-8228
  • eISSN : 2288-8241

Editorial Office

Title Optical properties and constants of Ga-doped ZnO thin films grown on muscovite mica substrates for optoelectronic applications
Authors 김영규(Younggyu Kim); 임재영(Jae Young Leem)
DOI https://doi.org/10.3365/KJMM.2016.54.2.117
Page pp.117-124
ISSN 1738-8228(ISSN), 2288-8241(eISSN)
Keywords zinc oxide; optical properties; optical constants; sol-gel; Ga doping
Abstract Ga-doped ZnO (GZO) thin films were grown on muscovite mica substrates by sol-gel spin-coating. The effects of post-annealing on the optical properties and constants of the GZO thin films were investigated. All the films exhibited strong near-band-edge emission in the UV range, while the defect-related deep-level emission in the visible region was only observed at 600 ℃. The average transmittance of the films was about 75% in the visible region and the sharp absorption edges were shifted toward a higher wavelength and became sharper with an increase in the post-annealing temperature. The refractive index was measured for the as-grown and annealed GZO thin film at 500 ℃. The single oscillator energy, dispersion energy, M-1 and M-3 moments, average oscillator strength and wavelength, and the refractive index at an infinite wavelength were obtained from the refractive index values of the films. In addition, the real and imaginary parts of the dielectric constant and optical conductivity of the films were measured.(Received April 7, 2015)