The Journal of
the Korean Journal of Metals and Materials

The Journal of
the Korean Journal of Metals and Materials

Monthly
  • pISSN : 1738-8228
  • eISSN : 2288-8241

Editorial Office

Title The Stabilizing Effects of PMMA Passivation on Solution- Processed Indium-Zinc Oxide Thin-Film Transistors
Authors 허관준(Kwan Jun Heo); 엄주송(Ju Song Eom); 조현아(Hyeonah Jo); 최성곤(Seong Gon Choi); 정병준(Byung Jun Jung); 김성진(Sung Jin Kim)
DOI https://doi.org/10.3365/KJMM.2016.54.4.270
Page pp.270-274
ISSN 1738-8228(ISSN), 2288-8241(eISSN)
Keywords thin films; sol-gel; electrical properties; electrical; indium zinc oxide thin film transictors; TFTs
Abstract We investigated poly(methyl methacrylate) (PMMA) passivation of solution-processed indium zinc oxide (IZO) thin-film transistors (TFTs). PMMA provides solution-processability and good barrier characteristics against environmental elements such as water and oxygen. The PMMA passivation layers protect the IZO active layer of the TFTs without deteriorating their performance during gate bias stress measurements under ambient conditions, and improve their electrical properties by decreasing leakage current. Moreover, the potential to safely manipulate IZO-TFTs after PMMA passivation was proven by realizing a simple n-channel resistive-load inverter.