The Journal of
the Korean Journal of Metals and Materials

The Journal of
the Korean Journal of Metals and Materials

Monthly
  • pISSN : 1738-8228
  • eISSN : 2288-8241

Editorial Office

  1. Home
  2. All Issues
  3. 2019-02 (Vol.57, No.2)
  4. 10.3365/KJMM.2019.57.2.124
XML PDF INFO REF

REFERENCES

1 
Khoshnoud F., de Silva C. W., IEEE Instrum. Meas. Mag,15, 14 (2012)Google Search
2 
Kim M. G., Hong T. W., Korean J. Met. Mater,56, 406 (2018)Google Search
3 
Miller L. M., Halvorsen E., Dong T., Wright P. K., J. Micromech. Microeng,21, 045029 (2011)Google Search
4 
Mohammadamir G., Reinoud F. W., J. Phys. Conf. Ser,757, 012032 (2016)Google Search
5 
Kim K., Met. Mater. Int,23, 326 (2017)Google Search
6 
Kim J. S., Ahn J., Electron. Mater. Lett,14, 533 (2018)Google Search
7 
Zwol P. J. van, Nasalevich M., Voorthuijzen W. P., Kurganova E., Notenboom A., Vles D., Peter M., Symens W., Giesbers A. J. M., Klootwijk J. H., van de Kruijs R. W. E., van der Zande W. J., Proc. SPIE Photomask Technology,10451O, SPIE, (2017)Google Search
8 
Hong J., Park C., Lee C., Nam K., Jang Y., Wi S., Ahn J., Proc. SPIE Photomask Technology + Extreme Ultraviolet Lithography,108090R, SPIE (2018)Google Search
9 
Greer J. R., Oliver W. C., Nix W. D., Acta. Mater,53, 1821 (2005)Google Search
10 
Jang D., Greer J. R., Nat. Mater,9, 215 (2010)Google Search
11 
Edalatpour S., Francoeur M., J. Quant. Spectros. Radiat. Transfer,118, 75 (2013)Google Search
12 
Vlassak J. J., Nix W. D., J. Mater. Res,7, 3242 (2011)Google Search
13 
Xiang Y., Chen X., Vlassak J. J., J. Mater. Res,20, 2360 (2011)Google Search
14 
Edwards R. L., Coles G., Sharpe W. N., Exp. Mech,44, 49 (2004)Google Search
15 
Merle B., Goken M., Acta. Mater,59, 1772 (2011)Google Search
16 
Gao H., Ji B., Jager I. L., Arzt E., Fratzl P., Proc. Natl. Acad. Sci. USA,100, 5597 (2003)Google Search
17 
Lee H. C., Kim E. J., Kim J. W., Oh H. K., J. Korean Phys. Soc,61, 1093 (2012)Google Search
18 
Zwol P. J. van, Vles D. F., Voorthuijzen W. P., Péter M., Vermeulen H., van der Zande W. J., Sturm J. M., van de Kruijs R. W. E., Bijkerk F., J. Appl. Phys,118, 213107 (2015)Google Search
뒤로가기