The Journal of
the Korean Journal of Metals and Materials

The Journal of
the Korean Journal of Metals and Materials

Monthly
  • pISSN : 1738-8228
  • eISSN : 2288-8241

Editorial Office

REFERENCES

1 
Lee J., Lim K.-H., Kim Y. S., Scientific Reports,8, 13905 (2018)Google Search
2 
Kim J. Y., Choe G., An T. K., Jeong Y. J., Korean J. Met. Mater,59, 162 (2021)Google Search
3 
Marroun A., Touhami N. A., Hamadi T., Transactions on Electrical and Electronic Materials,22, 645 (2021)Google Search
4 
Shan F., Lee J.-Y., Kim H.-S., Sun H.-Z., Choi S. G., Heo K.-J., Koh J.-H., Kim S.-J., Electronic Materials Letter,17, 222 (2021)Google Search
5 
Shan F., Lee J.-Y., Zhao H.-L., Choi S. G., Koh J.-H., Kim S.-J., Electronic Materials Letter,17, 451 (2021)Google Search
6 
Hsieh H. H., Lu H. H., Ting H. C., Chuang C. S., Chen C. Y., Lin Y., Journal of Information Display,11, 160 (2010)Google Search
7 
Mizukami M., Cho S., Watanabe K., Abiko M., Suzuri Y., Tokito S., Kido J., IEEE Electron Device Letters,39, 39 (2018)Google Search
8 
Takei K., Honda W., Harada S., Arie T., Akita S., Advanced Healthcare Materials,4, 487 (2014)Google Search
9 
Jeong J. K., Jeong J. H., Yang H. W., Park J.-S., Mo Y.-G., Kim H. D., Applied Physics Letters,91, 113505 (2007)Google Search
10 
Lee S., Chen Y., Jeon J., Park C., Jang J., Advanced Electronic Materials,4, 1700550 (2018)Google Search
11 
Tiwari N., Rajput M., John R. A., Kulkarni M. R., Nguyen A. C., Mathews N., ACS Applied Materials & Interfaces,10, 30506 (2018)Google Search
12 
Xin C., Chen L., Li T., Zhang Z., Zhao T., Li X., Zhang J., IEEE Electron Device Letters,39, 1073 (2018)Google Search
13 
Geng D., Han S., Seo H., Mativenga M., Jang J., IEEE Sensors Journal,17, 585 (2017)Google Search
14 
Shao Y., Xiao X., He X., Deng W., Zhang S., IEEE Electron Device Letters,36, 573 (2015)Google Search
15 
Su N. C., Wang S. J., Chin A., IEEE Electron Device Letters,30, 1317 (2009)Google Search
16 
Yao R., Zheng Z., Xiong M., Zhang X., Li X., Ning H., Fang Z., Xie W., Lu X., Peng J., Applied Physics Letters,112, 103503 (2018)Google Search
17 
Ma P., Du L., Wang Y., Jiang R., Xin Q., Li Y., Song A., Applied Physics Letters,112, 023501 (2018)Google Search
18 
Peng C., Yang S., Pan C., Li X., Zhang J., IEEE Transactions on Electron Devices,67, 4262 (2020)Google Search
19 
Lee M. K., Kim C., Park J. W., Kim E., Seol M., Park J., Choi Y., Park S. K., Choi K. C., IEEE Transactions on Electron Devices,64, 3189 (2017)Google Search
20 
Um J. G., Jang J., Applied Physics Letters,112, 162104 (2018)Google Search
21 
Kim M.-H., Choi M.-J., Kimura K., Kobayashi H., Choi D.-K., Solid-State Electronics,126, 87 (2016)Google Search
22 
Sayyed A. J., Mohite L. V., Deshmukh N. A., Pinjari D. V., Ultrasonics Sonochemistry,49, 161 (2018)Google Search
23 
Wu H., Zheng H., Li Y., Ohl C.-D., Yu H., Li D., Ultrasonics Sonochemistry,78, 105735 (2021)Google Search
24 
Consiglio A., Ukpai G., Rubinsky B., Powell-Palm M. J., Physical Review Research,2, 023350 (2020)Google Search
25 
Muller P. B., Rossi M., Marín Á. G., Barnkob R., Augustsson P., Laurell T., Kähler C. J., Bruus H., Physical Review E,88, 023006 (2013)Google Search
26 
Kollath A., Brezhneva N., Skorb E. V., Andreeva D. V., Physical Chemistry Chemical Physics,19, 6286 (2017)Google Search
27 
Zhang L., Belova-Magri V., Wang H., Dong W.-F., Moehwald H., Chemistry of Materials,26, 2244 (2014)Google Search
28 
Libsch F. R., Kanicki J., Applied Physics Letters,62, 1286 (1993)Google Search
29 
Gu G., Kane M. G., Mau S.-C., Journal of Applied Physics,101, 014504 (2007)Google Search
30 
Han C. Y., Song J. Q., Tang W. M., Leung C. H., Lai P. T., Applied Physics Letters,107, 033503 (2015)Google Search
31 
Obaidulla S. M., Goswami D. K., Giri P. K., Applied Physics Letters,104, 213302 (2014)Google Search
32 
Hwang D. K., Oh M. S., Hwang J. M., Kim J. H., Im S., Applied Physics Letters,92, 013304 (2008)Google Search
33 
Hua M., Wei J., Bao Q., Zhang Z., Zheng Z., Chen K. J., IEEE Electron Device Letters,39, 413 (2018)Google Search
34 
Lee S. W., Suh D., Lee S. Y., Lee Y. H., Applied Physics Letters,104, 163506 (2014)Google Search
35 
Cho E. N., Kang J. H., Kim C. E., Moon P., Yun I., IEEE Transactions on Device and Materials Reliability,11, 112 (2011)Google Search