The Journal of
the Korean Journal of Metals and Materials

The Journal of
the Korean Journal of Metals and Materials

Monthly
  • pISSN : 1738-8228
  • eISSN : 2288-8241

Editorial Office

REFERENCES

1 
Beesley J. G., Schönholzer U, Slicing 80 micrometer wafers–process parameters in the lower dimensions,Proc. 22nd Eur. PVSEC, 956-962, (2007)Google Search
2 
Van Mierlo F., Jonczyk R., Qian V., Energy Procedia,130, 2 (2017)Google Search
3 
M. Fischer, International Technology Roadmap for Photovoltaic (ITRPV) - Results 2018, pp.1–38, Itrpv. http://www.itrpv.net/, (2019)
4 
Lee H., Kim K., Song O., Korean J. Met. Mater,58, 59 (2019)Google Search
5 
Song B. -K., Jung J. -Y., Cho Y. -R., Rha J. -J., Kim J. W., Kim Y. -K., Korean J. Met. Mater,58, 201 (2020)Google Search
6 
Dross F., Milhe A., Robbelein J., Gordon I., Bouchard P. -O., Beaucarne G, Poortmans J., Stress-Induced Lift-Off Method for kerf-loss-free wafering of ultra-thin (~50 um) crystalline Si wafers,2008 33rd IEEE Photovolatic Spec. Conf, 10.1109/PVSC.2008.4922741, 1-5, (2008)Google Search
7 
Mizushima I., Sato T., Taniguchi S., Tsunashima Y., Appl. Phys. Lett,77, 3290 (2000)Google Search
8 
Gordon I., Carnel L., Van Gestel D., Beaucarne G., Poortmans J., Prog. Photovoltaics Res. Appl,15, 575 (2007)Google Search
9 
Nast O., Wenham S.R., J. Appl. Phys,88, 124 (2000)Google Search
10 
Van Gestel D., Romero M. J., Gordon I., Carnel L., D’Haen J., Beaucarne G., Al-Jassim M., Poortmans J., Appl. Phys. Lett,90, 92103 (2007)Google Search
11 
Henley F., Kang S., Liu Z., Tian L., Wang J., Chow Y. L., Beam-induced wafering technology for kerf-free thin PV manufacturing, Conf. Rec. IEEE Photovolt. Spec. Conf, 10.1109/PVSC.2009.5411435, (2009)Google Search
12 
Henley F. J., Kerf-free wafering: Technology overview and challenges for thin PV manufacturing, 2010 35th IEEE Photovolt. Spec. Conf. IEEE, 10.1109/PVSC.2010.5614096, (2010)Google Search
13 
Masolin A., Vaes J., Dross F., Poortmans J., Mertens R., Thermal curing of crystallographic defects on a slim-cut silicon foil, Conf. Rec. IEEE Photovolt. Spec. Conf, 10.1109/PVSC.2010.5614096, 2180-2183, (2010)Google Search
14 
Bellanger P., Brito M. C., Pera D. M., Costa I., Gaspar G., Martini R., Debucquoy M., Serra J. M., IEEE J. Photovoltaics,4, 1228 (2014)Google Search
15 
Bedell S. W., Shahrjerdi D., Hekmatshoar B., Fogel K., Lauro P. A., Ott J. A., Sosa N., Sadana D., IEEE J. Photovoltaics,2, 141 (2012)Google Search
16 
Niepelt R., Hensena J., Knorr A., Steckenreiter V., Kajari-Schoder S., Brendel R., Energy Procedia,55, 570 (2014)Google Search
17 
Gordon I., Dross F., Depauw V., Masolin A., Qiu Y., Vaes J., Van Gestel D., Poortmans J., Sol. Energy Mater. Sol. Cells,95, S2 (2011)Google Search
18 
Lee Y. H., Cha H., Choi S., Chang H. S., Jang B., Oh J., Electron. Mater. Lett,14, 363 (2018)Google Search